Abstract The electroluminscent zinc sulfide thin film doped with erbium, fabri cated by thermal evaporation with two boats, are examined. The surface and internal electronic states of ZnS thin film are measured by means of X-ray diffracti on and X-ray photoemission spectroscopy. The information on the relations between electroluminescent characteristics and internal electronic states of the film is obtained. And the effects of the microstructure of thin film doped with rare earth erbium on electroluminescence are discussed as well.
Received: 18 March 1997
Accepted manuscript online:
Fund: Project supported by the Natural Science Foundation of Fujian Province.
Cite this article:
LIU ZHAO-HONG (柳兆洪), WANG YU-JIANG (王余姜), CHEN MOU-ZHI (陈谋智), CHEN ZHEN-XIANG (陈振湘), SUN SHU-NONG (孙书农), HUANG MEI-CHUN (黄美纯) STUDY OF MICROSTRUCTURE AND ELECTROLUMINESCENCE OF ZINC SULFIDE THIN FILM 1998 Acta Physica Sinica (Overseas Edition) 7 209
Altmetric calculates a score based on the online attention an article receives. Each coloured thread in the circle represents a different type of online attention. The number in the centre is the Altmetric score. Social media and mainstream news media are the main sources that calculate the score. Reference managers such as Mendeley are also tracked but do not contribute to the score. Older articles often score higher because they have had more time to get noticed. To account for this, Altmetric has included the context data for other articles of a similar age.
