Abstract Transverse spatial modulation of beam profiles for a probe beam counterpropagating to a pump beam in a 45°-cut BaTiO3:Ce crystal with an externally applied electric field is studied numerically studied. For the case that the direct ion of the external field makes an angle of 45° with the c-axis of the crystal, the probe beam, which propagates in the direction perpendicular to the external field and has a waist wider than that of the pump beam, can acquire deep spatial modulation. In contrast, the pump beam shows no spatial modulation but diffracts only. For the case the external field is directed opposite to the direction mentioned above, the probe beam shows much stronger spatial modulation as compared to the pump.
Received: 02 May 1995
Accepted manuscript online:
PACS:
42.65.Re
(Ultrafast processes; optical pulse generation and pulse compression)
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