Broadband achromatic phase retarder based on metal-multilayer dielectric grating

doi:10.1088/1674-1056/27/5/054202

Abstract A new achromatic phase retarder based on a metal-multilayer dielectric grating structure is designed using the rigorous coupled wave analysis method and the genetic algorithm. The optimized phase retarder can maintain phase retardation around 90° from 900 nm to 1200 nm, and the maximum deviation is less than 4.5% while the diffraction efficiencies of TE and TM waves are both higher than 95%. Numerical analysis shows the designed phase retarder has a high fabrication tolerance of groove depth, duty cycle and incident angle. This achromatic phase retarder is simple in design and stable in performance, and can be widely used in optical systems.

Keywords: achromatic phase retarder metal-multilayer dielectric grating rigorous coupled wave analysis (RCWA) genetic algorithm (GA)

Received: 08 November 2017
Revised: 24 January 2018
Accepted manuscript online:

PACS:	42.15.Eq	(Optical system design)
	42.40.Lx	(Diffraction efficiency, resolution, and other hologram characteristics)
	42.79.Dj	(Gratings)
	42.87.Bg	(Phase shifting interferometry)

Fund: Project supported by the National Natural Science Foundation of China (Grant No.11274188)

Corresponding Authors: Wei-Jin Kong
E-mail: kwjsd@163.com

Cite this article:

Na Li(李娜), Wei-Jin Kong(孔伟金), Feng Xia(夏峰), Mao-Jin Yun(云茂金) Broadband achromatic phase retarder based on metal-multilayer dielectric grating 2018 Chin. Phys. B 27 054202

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Broadband achromatic phase retarder based on metal-multilayer dielectric grating

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