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Chin. Phys. B, 2014, Vol. 23(6): 065203    DOI: 10.1088/1674-1056/23/6/065203

Energy spectrum of multi-radiation of X-rays in a low energy Mather-type plasma focus device

Farzin M. Aghamir, Reza A. Behbahani
Department of Physics, University of Tehran, N. Kargar Ave., Tehran 143399, Iran
Abstract  The multi-radiation of X-rays was investigated with special attention to their energy spectrum in a Mather-type plasma focus device (operated with argon gas). The analysis is based on the effect of anomalous resistances. To study the energy spectrum, a four-channel diode X-ray spectrometer was used along with a special set of filters. The filters were suitable for detection of medium range X-rays as well as hard X-rays with energy exceeding 30 keV. The results indicate that the anomalous resistivity effect during the post pinch phase may cause multi-radiation of X-rays with a total duration of 300± 50 ns. The significant contribution of Cu-Kα was due to the medium range X-rays, nonetheless, hard X-rays with energies greater than 15 keV also participate in the process. The total emitted X-ray energy in the forms of Cu-Kα and Cu-Kβ was around 0.14± 0.02 (J/Sr) and 0.04± 0.01 (J/Sr), respectively. The total energy of the emitted hard X-ray (> 15 keV) was around 0.12± 0.02 (J/Sr).
Keywords:  Mather-type plasma focus device      hard X-rays      multi-radiation      tube multiple voltage peaks      anomalous resistances  
Received:  27 October 2013      Revised:  11 January 2014      Published:  15 June 2014
PACS:  52.58.Lq (Z-pinches, plasma focus, and other pinch devices)  
  52.59.Px (Hard X-ray sources)  
  52.70.La (X-ray and γ-ray measurements)  
  33.20.Rm (X-ray spectra)  
Corresponding Authors:  Farzin M. Aghamir     E-mail:

Cite this article: 

Farzin M. Aghamir, Reza A. Behbahani Energy spectrum of multi-radiation of X-rays in a low energy Mather-type plasma focus device 2014 Chin. Phys. B 23 065203

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