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Chin. Phys. B, 2010, Vol. 19(7): 074217    DOI: 10.1088/1674-1056/19/7/074217
ELECTROMAGNETISM, OPTICS, ACOUSTICS, HEAT TRANSFER, CLASSICAL MECHANICS, AND FLUID DYNAMICS Prev   Next  

Theoretical and experimental analyses of recording mark microstructures in signal waveform modulation optical disc

Liu Hai-Long(刘海龙)a)b)†, Pei Jing(裴京)a), Ni Yi(倪屹)a), Pan Long-Fa(潘龙法)a), and Tang Yi(唐毅) a)
a Optical Memory National Engineering Research Center, Department of Precision Instrument, Tsinghua University, Beijing 100084, China; b Measurement Technology & Instrumentation Key Lab of Hebei Province, Yanshan University, Qinhuangdao 066004, China
Abstract  In this paper, we propose a dynamic mastering process model for signal waveform modulation (SWM) optical disc. To form the ideal microstructures and solve the problems in the SWM master manufacturing process, we use this model to simulate the three-dimensional mark profiles in the SWM read-only disc. The simulated micro-patterns of recording pits and lands are employed to optimize the writing strategy and provide a quantitative basis for manufacturing the sub-pits and sub-lands. The simulation mark profiles are compared with the experimental ones, which are produced with the optimized writing strategy parameters. Comparison results demonstrate that the simulated profiles are highly consistent with the actual ones.
Keywords:  mark microstructures      SWM      mastering model      writing strategy  
Accepted manuscript online: 
PACS:  42.79.Vb (Optical storage systems, optical disks)  
  42.82.Cr (Fabrication techniques; lithography, pattern transfer)  
  42.70.Ln (Holographic recording materials; optical storage media)  
Fund: Project supported by the National Natural Science Foundation of China (Grant Nos. 60977005 and 60677036).

Cite this article: 

Liu Hai-Long(刘海龙), Pei Jing(裴京), Ni Yi(倪屹), Pan Long-Fa(潘龙法), and Tang Yi(唐毅) Theoretical and experimental analyses of recording mark microstructures in signal waveform modulation optical disc 2010 Chin. Phys. B 19 074217

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