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Chin. Phys. B, 2009, Vol. 18(12): 5370-5374    DOI: 10.1088/1674-1056/18/12/042
CLASSICAL AREAS OF PHENOMENOLOGY Prev   Next  

Below-diffraction-limited hybrid recording using silicon thin film super-resolution structure

Jiao Xin-Bing(焦新兵), Wei Jing-Song(魏劲松), and Gan Fu-Xi(干福熹)
Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
Abstract  We report on new experimental results for below-diffraction-limited hybrid recording. In our experiments, by means of focused laser assisted magnetic recording, the magnetic domains within TbFeCo thin films are obtained under an external perpendicular direct magnetic field. For a single magnetic medium, the domain size is mainly determined by the focused spot, which is about 620 nm for the laser wavelength $\lambda$ = 406 nm, and a numerical aperture of the lens of 0.80. However, when a silicon thin film structure is inserted between the substrate and the magnetic medium, the recording domains can be reduced obviously. By optimizing the experimental condition, even the size can be reduced to about 100 nm, which is below the diffraction limit, i.e. about 1/6 of the spot size. This is very useful for improving the hybrid recording density in practical applications.
Keywords:  hybrid recording      super-resolution      magnetic recording  
Received:  19 March 2009      Revised:  24 April 2009      Accepted manuscript online: 
PACS:  68.55.-a (Thin film structure and morphology)  
  75.50.Ss (Magnetic recording materials)  
  75.60.Ch (Domain walls and domain structure)  
  75.70.Ak (Magnetic properties of monolayers and thin films)  
Fund: Project supported by the National Natural Science Foundation of China (Grant Nos 50772120 and 60490290), Funds of the Chinese Academy of Sciences for Key Topics in Innovation Engineering (Grant No KJCXZYW.NANO.06), and the National Basic Research Program

Cite this article: 

Jiao Xin-Bing(焦新兵), Wei Jing-Song(魏劲松), and Gan Fu-Xi(干福熹) Below-diffraction-limited hybrid recording using silicon thin film super-resolution structure 2009 Chin. Phys. B 18 5370

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