Absorptive reduction and width narrowing in $\Lambda$-type atoms confined between two dielectric walls
Li Yuan-Yuan(李院院)a)†, Hou Xun(侯洵)a)b), Bai Jin-Tao(白晋涛)a), Yan Jun-Feng(闫军锋)a), Gan Chen-Li(甘琛利)c), and Zhang Yan-Peng(张彦鹏)c)
a Institute of Photonics and Photonic Technology, Key Laboratory of Photoelectronic Technology of Shaanxi Province, Northwest University, Xi'an 710069, China; b State Key Laboratory of Transient Optics and Technology, Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi'an 710068, China; c Key Laboratory for Physical Electronics and Devices of the Ministry of Education, Xi'an Jiaotong University, Xi'an 710049, China
Abstract This paper investigates the absorptive reduction and the width narrowing of electromagnetically induced transparency (EIT) in a thin vapour film of $\Lambda $-type atoms confined between two dielectric walls whose thickness is comparable with the wavelength of the probe field. The absorptive lines of the weak probe field exhibit strong reductions and very narrow EIT dips, which mainly results from the velocity slow-down effects and transient behaviour of atoms in a confined system. It is also shown that the lines are modified by the strength of the coupling field and the ratio of $L / \lambda$, with $L$ the film thickness and $\lambda $ the wavelength of the probe field. A simple robust recipe for EIT in a thin medium is achievable in experiment.
Received: 19 October 2007
Revised: 20 November 2007
Accepted manuscript online:
PACS:
42.50.Gy
(Effects of atomic coherence on propagation, absorption, and Amplification of light; electromagnetically induced transparency and Absorption)
(Optical transient phenomena: quantum beats, photon echo, free-induction decay, dephasings and revivals, optical nutation, and self-induced transparency)
Cite this article:
Li Yuan-Yuan(李院院), Hou Xun(侯洵), Bai Jin-Tao(白晋涛), Yan Jun-Feng(闫军锋), Gan Chen-Li(甘琛利), and Zhang Yan-Peng(张彦鹏) Absorptive reduction and width narrowing in $\Lambda$-type atoms confined between two dielectric walls 2008 Chin. Phys. B 17 2885
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