Ellipsometric analysis and optical absorption characterization of gallium phosphide nanoparticulate thin film

doi:10.1088/1674-1056/20/4/047802

Abstract Gallium phosphide (GaP) nanoparticulate thin films were easily fabricated by colloidal suspension deposition via GaP nanoparticles dispersed in N,N-dimethylformamide. The microstructure of the film was performed by x-ray diffraction, high resolution transmission electron microscopy and field emission scanning electron microscopy. The film was further investigated by spectroscopic ellipsometry. After the model GaP+void|SiO₂ was built and an effective medium approximation was adopted, the values of the refractive index n and the extinction coefficient k were calculated for the energy range of 0.75 eV–4.0 eV using the dispersion formula in DeltaPsi2 software. The absorption coefficient of the film was calculated from its k and its energy gaps were further estimated according to the Tauc equation, which were further verified by its fluorescence spectrum measurement. The structure and optical absorption properties of the nanoparticulate films are promising for their potential applications in hybrid solar cells.

Keywords: ellipsometry optical energy gaps gallium phosphide particulate thin film

Received: 23 September 2010
Revised: 10 November 2010
Accepted manuscript online:

PACS:	78.67.-n	(Optical properties of low-dimensional, mesoscopic, and nanoscale materials and structures)
	78.67.Bf	(Nanocrystals, nanoparticles, and nanoclusters)
	78.20.-e	(Optical properties of bulk materials and thin films)
	07.60.Fs	(Polarimeters and ellipsometers)

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Zhang Qi-Xian(章启贤), Wei Wen-Sheng(魏文生), and Ruan Fang-Ping(阮方平) Ellipsometric analysis and optical absorption characterization of gallium phosphide nanoparticulate thin film 2011 Chin. Phys. B 20 047802

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Ellipsometric analysis and optical absorption characterization of gallium phosphide nanoparticulate thin film

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