A new method of detecting interferogram in differential phase-contrast imaging system based on special structured x-ray scintillator screen

doi:10.1088/1674-1056/19/7/070701

Abstract An x-ray scintillator screen with a special structure, functioning as detector and analyser grating, was proposed for collecting the interferogram of differential phase contrast imaging without absorption grating and difficulty of fabrication by a state of the art technique. On the basis of phase grating diffraction, a detecting model of the scintillator screen was built for analysing the phase and absorption information of objects. According to the analysis, a new method of phase retrievals based on two-images and the optimal structure of screen were presented.

Keywords: differential phase contrast x-ray scintillator screen phase retrieval

Accepted manuscript online:

PACS:	29.40.Mc	(Scintillation detectors)
	07.85.Fv	(X- and γ-ray sources, mirrors, gratings, and detectors)
	07.50.-e	(Electrical and electronic instruments and components)

Fund: Project supported by the National Natural Science Foundation of China (Grant Nos. 60232090 and 10774102), the Science & Technology Project from Shenzhen Government of China (Grant Nos. 2008340 and 200717).

Cite this article:

Liu Xin(刘鑫), Guo Jin-Chuan(郭金川), and Niu Han-Ben(牛憨笨) A new method of detecting interferogram in differential phase-contrast imaging system based on special structured x-ray scintillator screen 2010 Chin. Phys. B 19 070701

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A new method of detecting interferogram in differential phase-contrast imaging system based on special structured x-ray scintillator screen

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