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Chin. Phys. B, 2009, Vol. 18(11): 5029-5033    DOI: 10.1088/1674-1056/18/11/069
CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES Prev   Next  

High-temperature current conduction through three kinds of Schottky diodes

Li Fei(李菲), Zhang Xiao-Ling(张小玲), Duan Yi(段毅), Xie Xue-Song(谢雪松), and ü Chang-Zhi(吕长志)
Department of Electronic Information and Control Engineering, Beijing University of Technology, Beijing 100124, China
Abstract  Fundamentals of the Schottky contacts and the high-temperature current conduction through three kinds of Schottky diodes are studied. N-Si Schottky diodes, GaN Schottky diodes and AlGaN/GaN Schottky diodes are investigated by I--V--T measurements ranging from 300 to 523 K. For these Schottky diodes, a rise in temperature is accompanied with an increase in barrier height and a reduction in ideality factor. Mechanisms are suggested, including thermionic emission, field emission, trap-assisted tunnelling and so on. The most remarkable finding in the present paper is that these three kinds of Schottky diodes are revealed to have different behaviours of high-temperature reverse currents. For the n-Si Schottky diode, a rise in temperature is accompanied by an increase in reverse current. The reverse current of the GaN Schottky diode decreases first and then increases with rising temperature. The AlGaN/GaN Schottky diode has a trend opposite to that of the GaN Schottky diode, and the dominant mechanisms are the effects of the piezoelectric polarization field and variation of two-dimensional electron gas charge density.
Keywords:  Schottky diodes      Schottky barrier height      ideality factor      reverse current  
Received:  13 February 2009      Revised:  13 May 2009      Accepted manuscript online: 
PACS:  85.30.Kk (Junction diodes)  
  85.30.De (Semiconductor-device characterization, design, and modeling)  
  85.30.Hi (Surface barrier, boundary, and point contact devices)  
  79.40.+z (Thermionic emission)  
  73.40.Gk (Tunneling)  
  79.70.+q (Field emission, ionization, evaporation, and desorption)  
Fund: Project supported by the Foundation of Key Laboratory of General Armament Department, China (Grant No 5132030102QT0101).

Cite this article: 

Li Fei(李菲), Zhang Xiao-Ling(张小玲), Duan Yi(段毅), Xie Xue-Song(谢雪松), and ü Chang-Zhi(吕长志) High-temperature current conduction through three kinds of Schottky diodes 2009 Chin. Phys. B 18 5029

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