Wavefront depinning in semiconductor superlattices due to discrete-mapping failure
Wang Jun (王 军), Zheng Zhi-Gang (郑志刚)
Department of Physics and the Beijing-Hong Kong-Singapore Joint Center for Nonlinear and Complex Systems (Beijing), Beijing Normal University, Beijing 100875, China
Abstract We investigate the wavefronts depinning in current biased, infinitely long semiconductor superlattice systems by the method of discrete mapping and show that the wavefront depinning corresponds to the discrete mapping failure. For parameter values near the lower critical current in both discrete drift model (DD model) and discrete drift--diffusion model (DDD model), the mapping failure is determined by the important mapping step from the bottom of branch $\gamma$ to branch $\alpha$. For the upper critical parameters in DDD model, the key mapping step is from branch $\gamma$ to the top of the corresponding branch $\alpha$, and we may need several active wells to describe the wavefronts.
Received: 02 February 2008
Revised: 02 April 2008
Accepted manuscript online:
(Electronic transport in nanoscale materials and structures)
Fund: Project supported in part by the
State Key Program of National Natural Science of China (Grant No
70431002), the National Natural Science Foundation of China (Grant
No 10575010), the National Basic Research Program of China (Grant No
2007CB814805), and the
Foundation of Doctoral Training of China (Grant No 20060027009).
Cite this article:
Wang Jun (王 军), Zheng Zhi-Gang (郑志刚) Wavefront depinning in semiconductor superlattices due to discrete-mapping failure 2008 Chin. Phys. B 17 4129
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