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Chinese Physics, 2007, Vol. 16(11): 3285-3289    DOI: 10.1088/1009-1963/16/11/023
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Analysis of second-harmonic generation microscopy under refractive index mismatch

Wang Xiang-Hui(王湘晖)a)b)†, Lin Lie(林列)a)b), and Zhang Yang(张杨)a)b)
The Key Laboratory of Opto-electronic Information Science and Technology, the Ministry of Education, Tianjin 300071, China; Institute of Modern Optics, Nankai University, Tianjin 300071, China
Abstract  On the basis of the vector diffraction theory and Green’s function method, this paper investigates the effects of refractive index mismatch on second-harmonic generation (SHG) microscopy. The polarization distribution and SHG intensity are calculated as functions of the sample radius and probe depth. The numerical results show that refractive index mismatch can result in peak intensity degradation, increase secondary lobes and extension of secondharmonic polarization distribution. Because of the attenuation of polarization intensity, the detected SHG intensity significantly decreases with increasing probe depth, which can limit the imaging depth of SHG microscopy inside thick samples. Forward SHG intensity decays slowly than backward SHG, due to the combination of extension secondharmonic polarization distribution and strong dependency of forward SHG on sample radius.
Keywords:  microscopy      second-harmonic generation      polarization      refractive index mismatch  
Accepted manuscript online: 
PACS:  42.65.Ky (Frequency conversion; harmonic generation, including higher-order harmonic generation)  
  07.60.Pb (Conventional optical microscopes)  
  42.15.Fr (Aberrations)  

Cite this article: 

Wang Xiang-Hui(王湘晖), Lin Lie(林列), and Zhang Yang(张杨) Analysis of second-harmonic generation microscopy under refractive index mismatch 2007 Chinese Physics 16 3285

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