Abstract A new composition content quaternary-alloy-based phase change thin film,Sb-rich AgInSbTe, has been prepared by DC-magnetron sputtering on a K9 glass substrate. After the film has been subsequently annealed at 200$^\circ$C for 30min, it becomes a crystalline thin film. The diffraction peak of antimony (Sb) are observed by shallow (0.5 degree) x-ray diffraction in the quaternary alloy thin film. The analyses of the measurement from differential scanning calorimetry (DSC) show that the crystallization temperature of the phase change thin film is about 190$^\circ$C and increases with the heating rate.By Kissinger plot, the activation energy for crystallization is determined to be 3.05eV. The reflectivity, refractive index and extinction coefficient of the crystalline and amorphous phase change thin films are presented. The optical absorption coefficient of the phase change thin films as a function of photon energy is obtained from the extinction coefficient. The optical band gaps of the amorphous and crystallization phase change thin films are 0.265eV and 1.127eV, respectively.
Received: 21 May 2004
Revised: 06 September 2004
Accepted manuscript online:
Fund: Project supported by National Natural Science Foundation of China (Grant No 60207005)
Cite this article:
Zhang Guang-Jun (张广军), Gu Dong-Hong (顾冬红), Gan Fu-Xi (干福熹) Optical properties and structure of Sb-rich AgInSbTe phase change thin films 2005 Chinese Physics 14 218
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