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Chinese Physics, 2003, Vol. 12(1): 107-111    DOI: 10.1088/1009-1963/12/1/320
CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES Prev   Next  

A study on the short-wavelength and high-numerical-aperture phase-change recording

Liu Bo (刘 波), Ruan Hao (阮 昊), Gan Fu-Xi (干福熹)
Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
Abstract  In this paper, we discuss the phase-change recording at a short-wavelength (514nm) and a high numerical aperture (0.85). Effects of recording power and pulse width on the size of the recording marks are studied. The minimum recording mark with a length of approximately 220nm has been observed. The capacity of about 17GB for a single-layer disc of a 12cm diameter can be obtained. The maximum carrier-to-noise ratio reaches 45dB at a writing power of 13--14mW.
Keywords:  phase-change      short-wavelength      high numerical aperture      transmission--electron microscopy   
Received:  29 May 2002      Revised:  12 September 2002      Accepted manuscript online: 
PACS:  68.37.Lp (Transmission electron microscopy (TEM))  
  42.79.Vb (Optical storage systems, optical disks)  
  42.79.Ag (Apertures, collimators)  
Fund: Project supported by the Foundation of the Shanghai Applied Physics Centre, and the National Natural Science Foundation of China (Grant No 59832060).

Cite this article: 

Liu Bo (刘 波), Ruan Hao (阮 昊), Gan Fu-Xi (干福熹) A study on the short-wavelength and high-numerical-aperture phase-change recording 2003 Chinese Physics 12 107

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