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Chin. Phys. B, 2016, Vol. 25(9): 098402    DOI: 10.1088/1674-1056/25/9/098402

Non-ionizing energy loss calculations for modeling electron-induced degradation of Cu(In, Ga)Se2 thin-film solar cells

Ming Lu(鲁明)1, Jing Xu(徐晶)1, Jian-Wei Huang(黄建微)2
1. Department of Physics, Yantai University, Yantai 264005, China;
2. National Institute of Metrology, Beijing 100013, China
Abstract  The lowest energies which make Cu, In, Ga, and Se atoms composing Cu(In, Ga)Se2 (CIGS) material displaced from their lattice sites are evaluated, respectively. The non-ionizing energy loss (NIEL) for electron in CIGS material is calculated analytically using the Mott differential cross section. The relation of the introduction rate (k) of the recombination centers to NIEL is modified, then the values of k at different electron energies are calculated. Degradation modeling of CIGS thin-film solar cells irradiated with various-energy electrons is performed according to the characterization of solar cells and the recombination centers. The validity of the modeling approach is verified by comparison with the experimental data.
Keywords:  Cu(In, Ga)Se2 solar cells      non-ionizing energy loss      electron irradiation  
Received:  20 April 2016      Revised:  11 May 2016      Accepted manuscript online: 
PACS:  84.60.Jt (Photoelectric conversion)  
  61.82.Fk (Semiconductors)  
  61.80.Jh (Ion radiation effects)  
Fund: Project supported by the National Natural Science Foundation of China (Grant No. 11547151).
Corresponding Authors:  Ming Lu     E-mail:

Cite this article: 

Ming Lu(鲁明), Jing Xu(徐晶), Jian-Wei Huang(黄建微) Non-ionizing energy loss calculations for modeling electron-induced degradation of Cu(In, Ga)Se2 thin-film solar cells 2016 Chin. Phys. B 25 098402

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