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Chin. Phys. B, 2016, Vol. 25(3): 037303    DOI: 10.1088/1674-1056/25/3/037303
CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES Prev   Next  

A subwavelength metal-grating assisted sensor of Kretschmann style for investigating the sample with high refractive index

Xu-Feng Li(李旭峰)1, Wei Peng(彭伟)2, Ya-Li Zhao(赵亚丽)3, Qiao Wang(王乔)2, Ji-Lin Wei(魏计林)1
1. School of Applied Science, Taiyuan University of Science and Technology, Taiyuan 030024, China;
2. School of Physics and Optoelectronic Technology, Dalian University of Technology, Dalian 116024, China;
3. No. 33 Research Institute of China Electronics Technology Group Corporation, Taiyuan 030024, China
Abstract  In this paper, a subwavelength metal-grating assisted sensor of Kretschmann style that is capable of detecting the sample with a refractive index higher than that of the substrate is proposed. The sensor configuration is similar to the traditional Kretschmann structure, but the metal film is pattered into a grating. As a TM-polarized laser beam impinges from the substrate, a resonant dip point in reflectance curve is produced at a certain incident angle. Our studies indicate that the sensing sensitivity and resolution are affected by the grating's gap and period, and after these parameters have been optimized, a sensing sensitivity of 51.484°/RIU is obtained with a slightly changing resolution.
Keywords:  surface plasmons      sensing      finite-difference time-domain method  
Received:  30 September 2015      Revised:  24 November 2015      Accepted manuscript online: 
PACS:  73.20.Mf (Collective excitations (including excitons, polarons, plasmons and other charge-density excitations))  
  07.07.Df (Sensors (chemical, optical, electrical, movement, gas, etc.); remote sensing)  
  02.60.Cb (Numerical simulation; solution of equations)  
Fund: Project supported by the National Natural Science Foundation of China (Grant Nos. 61137005 and 61178067), the Science Foundation of Shanxi Province, China (Grant No. 2013021004-3/2014021021-1), the Pre-studied Project on Weapon Equipment, China (Grant No. 201262401090404), and the Specialized Research Foundation for Doctor of School, China (Grant No. 20122027).
Corresponding Authors:  Xu-Feng Li     E-mail:  xfli@mail.dlut.edu.cn

Cite this article: 

Xu-Feng Li(李旭峰), Wei Peng(彭伟), Ya-Li Zhao(赵亚丽), Qiao Wang(王乔), Ji-Lin Wei(魏计林) A subwavelength metal-grating assisted sensor of Kretschmann style for investigating the sample with high refractive index 2016 Chin. Phys. B 25 037303

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