Elemental x-ray imaging using Zernike phase contrast

doi:10.1088/1674-1056/25/10/108702

Abstract We develop an element-specific x-ray microscopy method by using Zernike phase contrast imaging near absorption edges, where a real part of refractive index changes abruptly. In this method two phase contrast images are subtracted to obtain the target element: one is at the absorption edge of the target element and the other is near the absorption edge. The x-ray exposure required by this method is expected to be significantly lower than that of conventional absorption-based x-ray elemental imaging methods. Numerical calculations confirm the advantages of this highly efficient imaging method.

Keywords: x-ray imaging Zernike phase contrast elemental imaging

Received: 13 April 2016
Revised: 17 May 2016
Accepted manuscript online:

PACS:	87.59.-e	(X-ray imaging)
	68.37.Yz	(X-ray microscopy)
	87.64.mh	(Phase contrast and DIC)

Fund: Project supported by the National Basic Research Program of China (Grant No. 2012CB825801) and the National Natural Science Foundation of China (Grant Nos. 11505188, and 11305173).

Corresponding Authors: Pei-Ping Zhu, Yang-Chao Tian, Kun Gao
E-mail: zhupp@ihep.ac.cn;ychtian@ustc.edu.cn;gaokun@ustc.edu.cn

Cite this article:

Qi-Gang Shao(邵其刚), Jian Chen(陈健), Faiz Wali, Yuan Bao(鲍园), Zhi-Li Wang(王志立), Pei-Ping Zhu(朱佩平), Yang-Chao Tian(田扬超), Kun Gao(高昆) Elemental x-ray imaging using Zernike phase contrast 2016 Chin. Phys. B 25 108702

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