Please wait a minute...
Chin. Phys. B, 2014, Vol. 23(3): 038201    DOI: 10.1088/1674-1056/23/3/038201
INTERDISCIPLINARY PHYSICS AND RELATED AREAS OF SCIENCE AND TECHNOLOGY Prev   Next  

Residual stress induced wetting variation on electric brush-plated Cu film

Meng Ke-Ke (孟可可), Jiang Yue (江月), Jiang Zhong-Hao (江忠浩), Lian Jian-She (连建设), Jiang Qing (蒋青)
Key Laboratory of Automobile Materials, Department of Materials Science and Engineering, Jilin University, Changchun 130025, China
Abstract  Nanocrystalline Cu film with a mirror surface finishing is prepared by the electric brush-plating technique. The as-prepared Cu film exhibits a superhydrophilic behavior with an apparent water contact angle smaller than 10°. A subsequent increase in the water contact angle and a final wetting transition from inherent hydrophilicity with water contact angle smaller than 90° to apparent hydrophobicity with water contact angle larger than 90° are observed when the Cu film is subjected to natural aging. Analysis based on the measurement of hardness with nanoindentation and the theory of the bond-order-length-strength correlation reveals that this wetting variation on the Cu film is attributed to the relaxation of residual stress generated during brush-plating deposition and a surface hydrophobization role associated with the broken bond polarization induced by surface nanostructure.
Keywords:  superhydrophilicity      wetting transition      residual stress      nano indenter  
Received:  04 July 2013      Revised:  08 November 2013      Accepted manuscript online: 
PACS:  82.70.Uv (Surfactants, micellar solutions, vesicles, lamellae, amphiphilic systems, (hydrophilic and hydrophobic interactions))  
  61.30.Hn (Surface phenomena: alignment, anchoring, anchoring transitions, surface-induced layering, surface-induced ordering, wetting, prewetting transitions, and wetting transitions)  
  83.85.St (Stress relaxation ?)  
  62.20.Qp (Friction, tribology, and hardness)  
Fund: Project supported by the National Natural Science Foundations of China (Grant No. 51371089) and the Foundation of National Key Basic Research and Development Program of China (Grant No. 2010CB 631001).
Corresponding Authors:  Jiang Zhong-Hao     E-mail:  jzh@jlu.edu.cn

Cite this article: 

Meng Ke-Ke (孟可可), Jiang Yue (江月), Jiang Zhong-Hao (江忠浩), Lian Jian-She (连建设), Jiang Qing (蒋青) Residual stress induced wetting variation on electric brush-plated Cu film 2014 Chin. Phys. B 23 038201

[1] Jiang L, Wang R, Yang B, Li T J, Tryk D A, Fujishima A, Hashimoto K and Zhu D B 2000 Pure Appl. Chem. 72 73
[2] Feng X J and Jiang L 2006 Adv. Mater. 18 3063
[3] Bhushan B and Jung Y C 2011 Prog. Mater. Sci. 56 1
[4] Feng X J, Zhai J and Jiang L 2005 Angew. Chem. Int. Ed. 44 5115
[5] Gu C D, Zhang J and Tu J P 2010 J. Colloid Interf. Sci. 352 573
[6] Gong M G, Xu X L, Yang Z, Liu Y S and Liu L 2010 Chin. Phys. B 19 056701
[7] Powell M R, Cleary L, Davenport M, Shea K J and Siwy Z S 2011 Nat. Nanotech. 6 798
[8] Yang Z, Wu Y Z, Ye Y F, Gong M G and Xu X L 2012 Chin. Phys. B 21 126801
[9] Wang G Y and Zhang T Y 2012 J. Colloid Interf. Sci. 377 438
[10] Larmour I A, Bell S E J and Saunders G C 2007 Angew. Chem. Int. Ed. 46 1710
[11] Gu C D, Ren H, Tu J P and Zhang T Y 2009 Langmuir 25 12299
[12] Wang S T, Feng L, Liu H, Sun T L, Zhang X, Jiang L and Zhu D B 2005 Chem. Phys. Chem. 6 1475
[13] Wang G Y and Zhang T Y 2012 ACS Appl. Mater. Interfaces 4 273
[14] Gong M G, Xu X L, Cao Z L, Liu Y Y and Zhu H M 2009 Acta Phys. Sin. 58 1885 (in Chinese)
[15] Liu H, Feng L, Zhai J, Jiang L and Zhu D B 2004 Langmuir 20 5659
[16] Hurtos E and Rodriguez-Viejo J 2000 J. Appl. Phys. 87 1748
[17] Song J Y and Yu J 2002 Thin Solid Films 415 167
[18] Kong D J, Zhang Y K, Chen Z G, Lu J Z, Feng A X, Ren X D and Ge T 2007 Acta Phys. Sin. 56 4056 (in Chinese)
[19] Kima S, Jang J H, Lee J S and Duquette D J 2007 Electrochim. Acta 52 5258
[20] Saitou M, Oshiro S and Sagawa Y 2008 J. Appl. Phys. 104 093518
[21] Cen M, Zhang Y G, Chen W L and Gu P F 2009 Acta Phys. Sin. 58 7025 (in Chinese)
[22] Shao I, Romankiw L T and Bonhote C 2010 J. Cryst. Growth 312 1262
[23] Schall J D and Brenner D W 2004 J. Mater. Res. 19 3172
[24] Wang L, Bei H, Gao Y F, Lu Z P and Nieh T G 2011 Acta Mater. 59 2858
[25] Shibata T, Irie H and Hashimoto K 2003 J. Phys. Chem. B 107 10696
[26] Qu Y H, Jiang D S, Wu D H, Niu Z C and Sun Z 2005 Chin. Phys. Lett. 22 2088
[27] Shibata T, Irie H, Tryk D A and Hashimoto K 2009 J. Phys. Chem. C 113 12811
[28] Wei W, Liu M, Qu S W and Zhang Q Y 2009 Acta Phys. Sin. 58 5736 (in Chinese)
[29] Michalske T A and Freiman S W 1982 Nature 295 511
[30] Sun H L, Song Z X and Xu K W 2008 Acta Phys. Sin. 57 5226 (in Chinese)
[31] Thouless M D, Gupta J and Harper J M E 1993 J. Mater. Res. 8 1845
[32] Lingk C and Gross M E 1998 J. Appl. Phys. 84 5547
[33] Moriyama M, Matsunaga K, Morita T, Tsukimoto S and Murakami M 2004 Mater. Trans. 45 3033
[34] Hwang S J, Lee Y D, Park Y B, Lee J H, Jeong C O and Joo Y C 2006 Scripta Mater. 54 1841
[35] Xu D, Kwan W L, Chen K, Zhang X, Ozolinš V and Tu K N 2007 Appl. Phys. Lett. 91 254105
[36] Xu D, Sriram V, Ozolins V, Yang J. M, Tu K. N, Stafford G R and Beauchamp C 2009 J. Appl. Phys. 105 023521
[37] Jiang Z H, Zhang H Z, Gu C D, Jiang Q and Lian J S 2008 J. Appl. Phys. 104 053505
[38] Suresh S and Giannakopoulos A E 1998 Acta Mater. 46 5755
[39] Kramer D E, Volinsky A A, Moody N R and Gerberich W W 2001 J. Mater. Res. 16 3150
[40] Mu J W, Jiang Z H, Zheng W T, Tian H W, Lian J S and Jiang Q 2012 J. Appl. Phys. 111 063506
[41] Sun C Q, Sun Y, Ni Y G, Zhang X, Pan J S, Wang X H, Zhou J, Li L T, Zheng W T, Yu S S, Pan L K and Sun Z 2009 J. Phys. Chem. C 113 20009
[42] Sun C Q 2009 Prog. Mater. Sci. 54 179
[1] Effect of an electric field on dewetting transition of nitrogen-water system
Qi Feng(冯琦), Jiaxian Li(厉嘉贤), Xiaoyan Zhou(周晓艳), and Hangjun Lu(陆杭军). Chin. Phys. B, 2022, 31(3): 036801.
[2] Numerical research on effect of overlap ratio on thermal-stress behaviors of the high-speed laser cladding coating
Xiaoxi Qiao(乔小溪), Tongling Xia(夏同领), and Ping Chen(陈平). Chin. Phys. B, 2021, 30(1): 018104.
[3] Laser-induced damage threshold in HfO2/SiO2 multilayer films irradiated by β-ray
Mei-Hua Fang(方美华), Peng-Yu Tian(田鹏宇), Mao-Dong Zhu(朱茂东), Hong-Ji Qi(齐红基), Tao Fei(费涛), Jin-Peng Lv(吕金鹏), Hui-Ping Liu(刘会平). Chin. Phys. B, 2019, 28(2): 024215.
[4] Evaluation of multiaxial stress in textured cubic films by x-ray diffraction
Zhang Jian-Min (张建民), Xu Ke-Wei (徐可为). Chin. Phys. B, 2005, 14(9): 1866-1872.
No Suggested Reading articles found!