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X-ray-boosted photoionization for the measurement of an intense laser pulse |
| Ge Yu-Cheng (葛愉成), He Hai-Ping (何海萍) |
| School of Physics and State Key Laboratory of Nuclear Physics and Technology, Peking University, Beijing 100871, China |
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Abstract Investigations show that the X-ray-boosted photoionization (XBP) has the following advantages for in-situ measurements of ultrahigh laser intensity I and field envelope F(t) (time t, pulse duration τL, carrier-envelope-phase φ): accuracy, dynamic ranges, and rapidness. The calculated XBP spectra resemble inversely proportional functions of the photoelectron momentum shift. The maximum momentum p and the observable value Q (defined as a double integration of a normalized photoelectron energy spectrum, PES) linearly depend on I1/2 and τL, respectively. φ and F(t) can be determined from the PES cut-off energy and peak positions. The measurable laser intensity can be up to and over 1018 W/cm2 by using high energy X-rays and highly charged inert gases.
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Received: 14 October 2012
Revised: 21 January 2013
Accepted manuscript online:
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PACS:
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32.80.Rm
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(Multiphoton ionization and excitation to highly excited states)
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42.50.Hz
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(Strong-field excitation of optical transitions in quantum systems; multiphoton processes; dynamic Stark shift)
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42.65.Re
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(Ultrafast processes; optical pulse generation and pulse compression)
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| Fund: Project supported by the National Natural Science Foundation of China (Grant No. 11175010). |
Corresponding Authors:
Ge Yu-Cheng
E-mail: gyc@pku.edu.cn
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Cite this article:
Ge Yu-Cheng (葛愉成), He Hai-Ping (何海萍) X-ray-boosted photoionization for the measurement of an intense laser pulse 2013 Chin. Phys. B 22 063201
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