Evolution of structure and magnetic properties of nanocrystalline FeXN thin films via Ta and Al addition

doi:10.1088/1009-1963/14/6/031

Abstract

Abstract Nanocrystalline FeAlN and FeTaN films are prepared by direct growth and crystallization of their as-deposited amorphous films, respectively. Although both films show soft magnetism of nanocrys-talline, the uniaxial anisotropy is to be observed different. Measurements of microstructure reveal that Ta addition leads to higher N-solubility in these films, and results in larger lattice dilation and more compressive stress. The uniaxial anisotropy is the consequence of the anisotropic distribution of inter-stitial N atoms in anα-Fe lattice. Al is easy to react with nitrogen, therefore, the α-Fe is purer in an FeAlN films than in an FeTaN ˉlm and the stress is tensile in FeAlN film. The difference of anisotropy may be attributed to the difference between the microstructures in both films.

Keywords: Fe-X-N thin film soft magnetic properties uniaxial anisotropy nanocrystalline

Received: 23 July 2004
Revised: 21 January 2005
Accepted manuscript online:

PACS:	75.50.Tt	(Fine-particle systems; nanocrystalline materials)
	75.50.Dd	(Nonmetallic ferromagnetic materials)
	75.50.Kj	(Amorphous and quasicrystalline magnetic materials)
	75.70.Ak	(Magnetic properties of monolayers and thin films)
	75.30.Gw	(Magnetic anisotropy)

Fund: Project supported by the National Natural Science Foundation of China ( Project No. 60371016) and Russian Foundation of Basic Research(Project No. 02-02-39006).

Cite this article:

Wu Guo-Guang (伍国光), Wu Dong-Ping (吴东平), Zheng Kuo-Hai (郑阔海), Wei Fu-Lin (魏福林), Yang Zheng (杨正), Kamzin A. S. Evolution of structure and magnetic properties of nanocrystalline FeXN thin films via Ta and Al addition 2005 Chinese Physics 14 1238

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Evolution of structure and magnetic properties of nanocrystalline FeXN thin films via Ta and Al addition

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