SCANNING AUGER ELECTRON SPECTROSCOPIC INVESTIGATIONS OF MAGNETOSTRICTIVE NANOSCALE MULTILAYERS
Alfred Ludwiga, Eberhard Noldb, Christel Adelhelmb, Shen Dian-hongc
a Center of Advanced European Studies and Research, Friedensplatz 16, D-53111 Bonn, FRG; b Forschungszentrum Karlsruhe GmbH,Institut für Materialforschung, 1, Postfach, 3640, D-76021 Karlsruhe, FRG; c Institute of Physics, Chinese Academy of Sciences, Beiing 100080, China
Abstract The characterisation of thin magnetostrictive multilayers in the nanometerscale range [(4,5nmTb40Fe60/9nmFe)×100] demands a surface sensitive analytical technique. A suitable technique is scanning Auger Electron Spectroscopy (AES) to determine the elemental composition, the thickness, the presence of interdiffusion between thin layers, or the presence of contamination at interfaces.Auger sputter depth profiles are obtained by using Xe-Ion bombardment to etch the sample.Sample rotation during sputtering produces shallow craters, minimises roughening and enhances depth resolution. In addition, Auger maps of the craters are used to reveal the separated magnetostrictive Tb40Fe60 layers and soft magnetic Fe layers.
Received: 05 March 2001
Accepted manuscript online:
Altmetric calculates a score based on the online attention an article receives. Each coloured thread in the circle represents a different type of online attention. The number in the centre is the Altmetric score. Social media and mainstream news media are the main sources that calculate the score. Reference managers such as Mendeley are also tracked but do not contribute to the score. Older articles often score higher because they have had more time to get noticed. To account for this, Altmetric has included the context data for other articles of a similar age.