Chin. Phys. B
中国物理B  2020, Vol. 29 Issue (6): 068703    DOI: 10.1088/1674-1056/ab8887
INTERDISCIPLINARY PHYSICS AND RELATED AREAS OF SCIENCE AND TECHNOLOGY 最新目录| 下期目录| 过刊浏览| 高级检索 |
Biases of estimated signals in x-ray analyzer-based imaging
Jianlin Xia(夏健霖), Wen Xu(徐文), Ruicheng Zhou(周瑞成), Xiaomin Shi(石晓敏), Kun Ren(任坤), Heng Chen(陈恒), Zhili Wang(王志立)
School of Electronic Science&Applied Physics, Hefei University of Technology, Hefei 230009, China
Biases of estimated signals in x-ray analyzer-based imaging
Jianlin Xia(夏健霖), Wen Xu(徐文), Ruicheng Zhou(周瑞成), Xiaomin Shi(石晓敏), Kun Ren(任坤), Heng Chen(陈恒), Zhili Wang(王志立)
School of Electronic Science&Applied Physics, Hefei University of Technology, Hefei 230009, China

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