Chin. Phys. B
中国物理B  2018, Vol. 27 Issue (6): 067802    DOI: 10.1088/1674-1056/27/6/067802
CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES 最新目录| 下期目录| 过刊浏览| 高级检索 |
Variable angle spectroscopic ellipsometry and its applications in determining optical constants of chalcogenide glasses in infrared
Ning-Ning Wei(韦宁宁), Zhen Yang(杨振), Hong-Bo Pan(潘宏波), Fan Zhang(张凡), Yong-Xing Liu(刘永兴), Rong-Ping Wang(王荣平), Xiang Shen(沈祥), Shi-Xun Dai(戴世勋), Qiu-Hua Nie(聂秋华)
1 Laboratory of Infrared Material and Devices, Advanced Technology Research Institute, Ningbo University, Ningbo 315211, China;
2 Key Laboratory of Photoelectric Materials and Devices of Zhejiang Province, Ningbo 315211, China
Variable angle spectroscopic ellipsometry and its applications in determining optical constants of chalcogenide glasses in infrared
Ning-Ning Wei(韦宁宁)1,2, Zhen Yang(杨振)1,2, Hong-Bo Pan(潘宏波)1,2, Fan Zhang(张凡)1,2, Yong-Xing Liu(刘永兴)1,2, Rong-Ping Wang(王荣平)1,2, Xiang Shen(沈祥)1,2, Shi-Xun Dai(戴世勋)1,2, Qiu-Hua Nie(聂秋华)1,2
1 Laboratory of Infrared Material and Devices, Advanced Technology Research Institute, Ningbo University, Ningbo 315211, China;
2 Key Laboratory of Photoelectric Materials and Devices of Zhejiang Province, Ningbo 315211, China

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