Chin. Phys. B
中国物理B  2016, Vol. 25 Issue (8): 087701    DOI: 10.1088/1674-1056/25/8/087701
SPECIAL TOPIC --- Non-equilibrium phenomena in soft matters 最新目录| 下期目录| 过刊浏览| 高级检索 |
Electron trapping properties at HfO2/SiO2 interface, studied by Kelvin probe force microscopy and theoretical analysis
Man-Hong Zhang(张满红)
School of Electrical and Electronic Engineering, North China Electric Power University, Beijing 102206, China
Electron trapping properties at HfO2/SiO2 interface, studied by Kelvin probe force microscopy and theoretical analysis
Man-Hong Zhang(张满红)
School of Electrical and Electronic Engineering, North China Electric Power University, Beijing 102206, China

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