Chin. Phys. B
  2014, Vol. 23 Issue (7): 076103    DOI: 10.1088/1674-1056/23/7/076103
CONDENSED MATTER: STRUCTURAL, MECHANICAL, AND THERMAL PROPERTIES 最新目录| 下期目录| 过刊浏览| 高级检索 |
Spectroscopic and scanning probe analysis on large-area epitaxial graphene grown under pressure of 4 mbar on 4H-SiC (0001) substrates
王党朝a, 张玉明b
a School of Physics and Electronic Engineering, Xianyang Normal University, Xianyang 712000, China;
b School of Microelectronics, Xidian University, Key Laboratory of Wide Band-gap Semiconductor Materials and Devices, Xidian University, Xi'an 710071, China
Spectroscopic and scanning probe analysis on large-area epitaxial graphene grown under pressure of 4 mbar on 4H-SiC (0001) substrates
Wang Dang-Chaoa, Zhang Yu-Mingb
a School of Physics and Electronic Engineering, Xianyang Normal University, Xianyang 712000, China;
b School of Microelectronics, Xidian University, Key Laboratory of Wide Band-gap Semiconductor Materials and Devices, Xidian University, Xi'an 710071, China

Copyright © the Chinese Physical Society
Address:Institute of Physics, Chinese Academy of Sciences, P. O. Box 603,Beijing 100190 China(100190)
Tel: 010-82649026   Fax: 010-82649027   E-Mail: cpb@aphy.iphy.ac.cn
Supported by Beijing Magtech Co. Ltd. Tel: 86-010-62662699 E-mail: support@magtech.com.cn