Chin. Phys. B
中国物理B  2011, Vol. 20 Issue (9): 096102    DOI: 10.1088/1674-1056/20/9/096102
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boldmath In situ high temperature X-ray diffraction studies of ZnO thin film
陈香存, 周解平, 王海洋, 徐彭寿, 潘国强
National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei 230029, China
boldmath In situ high temperature X-ray diffraction studies of ZnO thin film
Chen Xiang-Cun, Zhou Jie-Ping, Wang Hai-Yang, Xu Peng-Shou, Pan Guo-Qiang
National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei 230029, China

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