Chin. Phys. B
中国物理B  2011, Vol. 20 Issue (3): 037901    DOI: 10.1088/1674-1056/20/3/037901
CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES 最新目录| 下期目录| 过刊浏览| 高级检索 |
The charging stability of different silica glasses studied by measuring the secondary electron emission yield
Bertrand Poumellec1, 赵谡玲2
(1)ICMMO/LPCES, UMR CNRS-UPS 8182, Université de Paris Sud, 91405 Orsay Cedex, France; (2)Key Laboratory of Luminescence and Optical Information, Beijing Jiaotong University, Ministry of Education, Beijing 100044, China
The charging stability of different silica glasses studied by measuring the secondary electron emission yield
Bertrand Poumelleca, Zhao Su-Lingb
a ICMMO/LPCES, UMR CNRS-UPS 8182, Université de Paris Sud, 91405 Orsay Cedex, France; b Key Laboratory of Luminescence and Optical Information, Beijing Jiaotong University, Ministry of Education, Beijing 100044, China

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