Chin. Phys. B
中国物理B  2010, Vol. 19 Issue (10): 106803    DOI: 10.1088/1674-1056/19/10/106803
CONDENSED MATTER: STRUCTURAL, MECHANICAL, AND THERMAL PROPERTIES 最新目录| 下期目录| 过刊浏览| 高级检索 |
Deposition pressure effect on the surface roughness scaling of microcrystalline silicon films
朱志立, 丁艳丽, 王志永, 谷锦华, 卢景霄
School of Physical Engineering and Material Physics Laboratory, Zhengzhou University, Zhengzhou 450052, China
Deposition pressure effect on the surface roughness scaling of microcrystalline silicon films
Zhu Zhi-Li, Ding Yan-Li, Wang Zhi-Yong, Gu Jin-Hua, Lu Jing-Xiao
School of Physical Engineering and Material Physics Laboratory, Zhengzhou University, Zhengzhou 450052, China

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