中国物理B ›› 2014, Vol. 23 ›› Issue (6): 65203-065203.doi: 10.1088/1674-1056/23/6/065203

• PHYSICS OF GASES, PLASMAS, AND ELECTRIC DISCHARGES • 上一篇    下一篇

Energy spectrum of multi-radiation of X-rays in a low energy Mather-type plasma focus device

Farzin M. Aghamir, Reza A. Behbahani   

  1. Department of Physics, University of Tehran, N. Kargar Ave., Tehran 143399, Iran
  • 收稿日期:2013-10-27 修回日期:2014-01-11 出版日期:2014-06-15 发布日期:2014-06-15

Energy spectrum of multi-radiation of X-rays in a low energy Mather-type plasma focus device

Farzin M. Aghamir, Reza A. Behbahani   

  1. Department of Physics, University of Tehran, N. Kargar Ave., Tehran 143399, Iran
  • Received:2013-10-27 Revised:2014-01-11 Online:2014-06-15 Published:2014-06-15
  • Contact: Farzin M. Aghamir E-mail:aghamir@ut.ac.ir

摘要: The multi-radiation of X-rays was investigated with special attention to their energy spectrum in a Mather-type plasma focus device (operated with argon gas). The analysis is based on the effect of anomalous resistances. To study the energy spectrum, a four-channel diode X-ray spectrometer was used along with a special set of filters. The filters were suitable for detection of medium range X-rays as well as hard X-rays with energy exceeding 30 keV. The results indicate that the anomalous resistivity effect during the post pinch phase may cause multi-radiation of X-rays with a total duration of 300± 50 ns. The significant contribution of Cu-Kα was due to the medium range X-rays, nonetheless, hard X-rays with energies greater than 15 keV also participate in the process. The total emitted X-ray energy in the forms of Cu-Kα and Cu-Kβ was around 0.14± 0.02 (J/Sr) and 0.04± 0.01 (J/Sr), respectively. The total energy of the emitted hard X-ray (> 15 keV) was around 0.12± 0.02 (J/Sr).

关键词: Mather-type plasma focus device, hard X-rays, multi-radiation, tube multiple voltage peaks, anomalous resistances

Abstract: The multi-radiation of X-rays was investigated with special attention to their energy spectrum in a Mather-type plasma focus device (operated with argon gas). The analysis is based on the effect of anomalous resistances. To study the energy spectrum, a four-channel diode X-ray spectrometer was used along with a special set of filters. The filters were suitable for detection of medium range X-rays as well as hard X-rays with energy exceeding 30 keV. The results indicate that the anomalous resistivity effect during the post pinch phase may cause multi-radiation of X-rays with a total duration of 300± 50 ns. The significant contribution of Cu-Kα was due to the medium range X-rays, nonetheless, hard X-rays with energies greater than 15 keV also participate in the process. The total emitted X-ray energy in the forms of Cu-Kα and Cu-Kβ was around 0.14± 0.02 (J/Sr) and 0.04± 0.01 (J/Sr), respectively. The total energy of the emitted hard X-ray (> 15 keV) was around 0.12± 0.02 (J/Sr).

Key words: Mather-type plasma focus device, hard X-rays, multi-radiation, tube multiple voltage peaks, anomalous resistances

中图分类号:  (Z-pinches, plasma focus, and other pinch devices)

  • 52.58.Lq
52.59.Px (Hard X-ray sources) 52.70.La (X-ray and γ-ray measurements) 33.20.Rm (X-ray spectra)